1. Kumar, S., Majumdar, A. & Tien, C. L. The Differential-Discrete-Ordinate Method for Solutions of the Equation of Radiative-Transfer. Journal of Heat Transfer-Transactions of the Asme 112, 424-429 (1990).
2. Majumdar, A. & Bhushan, B. Role of Fractal Geometry in Roughness Characterization and Contact Mechanics of Surfaces. Journal of Tribology-Transactions of the Asme 112, 205-216 (1990).
3. Majumdar, A. & Tien, C. L. Effects of Surface-Tension on Film Condensation in a Porous-Medium. Journal of Heat Transfer-Transactions of the Asme 112, 751-757 (1990).
4. Majumdar, A. & Tien, C. L. Fractal Characterization and Simulation of Rough Surfaces. Wear 136, 313-327 (1990).
5. Carrejo, J. P., Thundat, T., Nagahara, L. A., Lindsay, S. M. & Majumdar, A. Scanning Tunneling Microscopy Investigations of Polysilicon Films under Solution. Journal of Vacuum Science & Technology B 9, 955-959 (1991).
6. Majumdar, A. Effect of Interfacial Roughness on Phonon Radiative Heat-Conduction. Journal of Heat Transfer-Transactions of the Asme 113, 797-805 (1991).
7. Majumdar, A. & Bhushan, B. Fractal Model of Elastic-Plastic Contact between Rough Surfaces. Journal of Tribology-Transactions of the Asme 113, 1-11 (1991).
8. Majumdar, A. & Tien, C. L. Fractal Network Model for Contact Conductance. Journal of Heat Transfer-Transactions of the Asme 113, 516-525 (1991).
9. Bhushan, B. & Majumdar, A. Elastic Plastic Contact Model for Bifractal Surfaces. Wear 153, 53-64 (1992).
10. Majumdar, A. et al. Nanometer-Scale Lithography Using the Atomic Force Microscope. Applied Physics Letters 61, 2293-2295 (1992).
11. Oden, P. I., Majumdar, A., Bhushan, B., Padmanabhan, A. & Graham, J. J. Afm Imaging, Roughness Analysis and Contact Mechanics of Magnetic-Tape and Head Surfaces. Journal of Tribology-Transactions of the Asme 114, 666-674 (1992).
12. Williamson, M. & Majumdar, A. Effect of Surface Deformations on Contact Conductance. Journal of Heat Transfer-Transactions of the Asme 114, 802-810 (1992).
13. Bawolek, E. J., Mohr, J. B., Hirleman, E. D. & Majumdar, A. Light Scatter from Polysilicon and Aluminum Surfaces and Comparison with Surface-Roughness Statistics by Atomic-Force Microscopy. Applied Optics 32, 3377-3400 (1993).
14. Joshi, A. A. & Majumdar, A. Transient Ballistic and Diffusive Phonon Heat-Transport in Thin-Films. Journal of Applied Physics 74, 31-39 (1993).
15. Majumdar, A. Microscale Heat-Conduction in Dielectric Thin-Films. Journal of Heat Transfer-Transactions of the Asme 115, 7-16 (1993).
16. Majumdar, A., Carrejo, J. P. & Lai, J. Thermal Imaging Using the Atomic Force Microscope. Applied Physics Letters 62, 2501-2503 (1993).
17. Marschall, J. & Majumdar, A. Charge and Energy-Transport by Tunneling Thermoelectric Effect. Journal of Applied Physics 74, 4000-4005 (1993).
18. Bhushan, B. & Majumdar, A. Fractal Theory of the Interfacial Temperature Distribution in the Slow Sliding Regime .1. Elastic Contact and Heat-Transfer Analysis - Discussion. Journal of Tribology-Transactions of the Asme 116, 822-822 (1994).
19. Fushinobu, K., Majumdar, A. & Hijikata, K. Heat-Generation and Transport in Submicron Semiconductor-Devices. Journal of Heat Transfer-Transactions of the Asme 117, 25-31 (1995).
20. Lai, J., Chandrachood, M., Majumdar, A. & Carrejo, J. P. Thermal Detection of Device Failure by Atomic-Force Microscopy. Ieee Electron Device Letters 16, 312-315 (1995).
21. Majumdar, A. Characterization and Contact Mechanics of Fractal and Non-Fractal Surfaces. Journal of Japanese Society of Tribologists 40, 539-544 (1995).
22. Majumdar, A., Fushinobu, K. & Hijikata, K. Effect of Gate Voltage on Hot-Electron and Hot-Phonon Interaction and Transport in a Submicrometer Transistor. Journal of Applied Physics 77, 6686-6694 (1995).
23. Majumdar, A. et al. Thermal Imaging by Atomic-Force Microscopy Using Thermocouple Cantilever Probes. Review of Scientific Instruments 66, 3584-3592 (1995).
24. Warren, T. L., Krajcinovic, D. & Majumdar, A. Atomic-Force Microscope Imaging of the Surface-Roughness of Scs-Coated and Tib2-Coated Sic Fibers and Uncoated Sapphire Fibers. Composites 26, 619-629 (1995).
25. Lai, J. & Majumdar, A. Concurrent thermal and electrical modeling of sub-micrometer silicon devices. Journal of Applied Physics 79, 7353-7361 (1996).
26. Luo, K., Shi, Z., Lai, J. & Majumdar, A. Nanofabrication of sensors on cantilever probe tips for scanning multiprobe microscopy. Applied Physics Letters 68, 325-327 (1996).
27. Majumdar, A., Luo, K., Shi, Z. & Varesi, J. Scanning thermal microscopy at nanometer scales: A new frontier in experimental heat transfer. Experimental Heat Transfer 9, 83-103 (1996).
28. Warren, T. L., Majumdar, A. & Krajcinovic, D. A fractal model for the rigid-perfectly plastic contact of rough surfaces. Journal of Applied Mechanics-Transactions of the Asme 63, 47-54 (1996).
29. Lai, J., Perazzo, T., Shi, Z. & Majumdar, A. Optimization and performance of high-resolution micro-optomechanical thermal sensors. Sensors and Actuators a-Physical 58, 113-119 (1997).
30. Luo, K., Herrick, R. W., Majumdar, A. & Petroff, P. Scanning thermal microscopy of a vertical-cavity surface-emitting laser. Applied Physics Letters 71, 1604-1606 (1997).
31. Luo, K., Lederman, M. & Majumdar, A. Liquid-film-mediated scanning thermal microscopy of a magnetoresistive reading head. Microscale Thermophysical Engineering 1, 333-345 (1997).
32. Luo, K., Shi, Z., Varesi, J. & Majumdar, A. Sensor nanofabrication, performance, and conduction mechanisms in scanning thermal microscopy. Journal of Vacuum Science & Technology B 15, 349-360 (1997).
33. Salapaka, M. V., Bergh, H. S., Lai, J., Majumdar, A. & McFarland, E. Multi-mode noise analysis of cantilevers for scanning probe microscopy. Journal of Applied Physics 81, 2480-2487 (1997).
34. Varesi, J., Lai, J., Perazzo, T., Shi, Z. & Majumdar, A. Photothermal measurements at picowatt resolution using uncooled micro-optomechanical sensors. Applied Physics Letters 71, 306-308 (1997).
35. Majumdar, A. Thermal microscopy and heat generation in electronic devices. Microelectronics Reliability 38, 559-565 (1998).
36. Majumdar, A. & Mezic, I. Stability regimes of thin liquid films. Microscale Thermophysical Engineering 2, 203-213 (1998).
37. Majumdar, A. & Varesi, J. Nanoscale temperature distributions measured by scanning joule expansion microscopy. Journal of Heat Transfer-Transactions of the Asme 120, 297-305 (1998).
38. Varesi, J. & Majumdar, A. Scanning Joule expansion microscopy at nanometer scales. Applied Physics Letters 72, 37-39 (1998).
39. Bergh, H. S. et al. An ultrahigh vacuum system for the fabrication and characterization of ultrathin metal-semiconductor films and sensors. Review of Scientific Instruments 70, 2087-2094 (1999).
40. Igeta, M., Inoue, T., Varesi, J. & Majumdar, A. Thermal expansion and temperature measurement in a microscopic scale by using the Atomic Force Microscope. Jsme International Journal Series B-Fluids and Thermal Engineering 42, 723-730 (1999).
41. Majumdar, A. Scanning thermal microscopy. Annual Review of Materials Science 29, 505-585 (1999).
42. Majumdar, A. & Mezic, I. Instability of ultra-thin water films and the mechanism of droplet formation on hydrophilic surfaces. Journal of Heat Transfer-Transactions of the Asme 121, 964-971 (1999).
43. Majumdar, A. & Norton, P. Uncooled infrared camera promises new uses. Laser Focus World 35, 121-+ (1999).
44. Miner, A., Majumdar, A. & Ghoshal, U. Thermoelectromechanical refrigeration based on transient thermoelectric effects. Applied Physics Letters 75, 1176-1178 (1999).
45. Nienhaus, H. et al. Ultrathin Cu films on Si(111): Schottky barrier formation and sensor applications. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films 17, 1683-1687 (1999).
46. Nienhaus, H. et al. Selective H atom sensors using ultrathin Ag Si Schottky diodes. Applied Physics Letters 74, 4046-4048 (1999).
47. Nienhaus, H. et al. Electron-hole pair creation at Ag and Cu surfaces by adsorption of atomic hydrogen and deuterium. Physical Review Letters 82, 446-449 (1999).
48. Nienhaus, H. et al. Photon shield for atomic hydrogen plasma sources. Journal of Vacuum Science & Technology A 17, 670-672 (1999).
49. Ohsone, Y., Wu, G., Dryden, J., Zok, F. & Majumdar, A. Optical measurement of thermal contact conductance between wafer-like thin solid samples. Journal of Heat Transfer-Transactions of the Asme 121, 954-963 (1999).
50. Perazzo, T. et al. Infrared vision using uncooled micro-optomechanical camera. Applied Physics Letters 74, 3567-3569 (1999).
51. Zhao, Y., Mao, M. & Majumdar, A. Application of fourier optics for detecting deflections of infrared-sensing microcantilever arrays. Microscale Thermophysical Engineering 3, 245-251 (1999).